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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Integrated Optics and Photonic Integrated Circuits - MicroRaman investigation of optical quality lithium niobate wafers

✍ Scribed by Caccavale, Federico; Morbiato, Alessandro; Properzi, Massimiliano; Galinetto, Pietro; Marinone, Massimo; Samoggia, Giorgio; Righini, Giancarlo C.; Honkanen, Seppo

Book ID: 121476241
Publisher: SPIE
Year: 2004
Weight: 75 KB
Volume: 5451
Category: Article
DOI: 10.1117/12.545848

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