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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Advances in Mirror Technology for X-Ray, EUV Lithography, Laser, and Other Applications - Development of an extreme-ultraviolet imaging spectrometer for the Mercury mission

✍ Scribed by Yoshikawa, Ichiro; Murachi, Tetsunori; Kameda, Shingo; Yamazaki, Atsushi; Okano, Shoichi; Nakamura, Masato; Khounsary, Ali M.; Dinger, Udo; Ota, Kazuya

Book ID: 120063363
Publisher: SPIE
Year: 2004
Weight: 394 KB
Volume: 5193
Category: Article
DOI: 10.1117/12.504964

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