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SPIE Proceedings [SPIE MOEMS-MEMS 2008 Micro and Nanofabrication - San Jose, CA (Saturday 19 January 2008)] Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS VII - Challenges of designing and processing extreme low-G microelectromechanical system (MEMS) accelerometers

โœ Scribed by Swiler, Thomas P.; Krishnamoorthy, Uma; Clews, Peggy J.; Baker, Michael S.; Tanner, Danelle M.; Hartzell, Allyson L.; Ramesham, Rajeshuni


Book ID
121189740
Publisher
SPIE
Year
2008
Weight
705 KB
Volume
6884
Category
Article

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