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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Design and characterization of a large-area integrating sphere uniform radiation source for calibration of satellite remote sensors

✍ Scribed by He, Yingwei; Li, Ping; Feng, Guojin; Wang, Yu; Liu, Zhilong; Zheng, Chundi; Wu, Houping; Zong, Xiaoying; Zhang, Yufeng; Li, Yongqiang; Sha, Dingguo; Zhang, Yudong; Sasián, José; Xiang, Libin; To, Sandy

Book ID
120632675
Publisher
SPIE
Year
2010
Weight
332 KB
Volume
7656
Category
Article

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