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Spectroscopic ellipsometry (SE) studies on vacuum-evaporated ZnSe thin films

✍ Scribed by S. Venkatachalam; D. Soundararajan; P. Peranantham; D. Mangalaraj; Sa.K. Narayandass; S. Velumani; P. Schabes-Retchkiman

Book ID: 113780084
Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 533 KB
Volume: 58
Category: Article
ISSN: 1044-5803
DOI: 10.1016/j.matchar.2006.11.026

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