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Spectroscopic ellipsometry of SiO2/CdTe nanocomposite thin films prepared by dc magnetron sputtering

✍ Scribed by S.K. Bera; D. Bhattacharyya; R. Ghosh; G.K. Paul

Publisher: Elsevier Science
Year: 2009
Tongue: English
Weight: 455 KB
Volume: 255
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2009.02.059

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