๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Specimen thickness determination in transmission electron microscopy in the general case

โœ Scribed by M. von Heimendahl

Book ID
103493933
Publisher
Elsevier Science
Year
1972
Weight
381 KB
Volume
4
Category
Article
ISSN
0047-7206

No coin nor oath required. For personal study only.

๐Ÿ“œ SIMILAR VOLUMES

Accurate determination of local defocus
Accurate determination of local defocus and specimen tilt in electron microscopy
โœ Joseph A. Mindell; Nikolaus Grigorieff ๐Ÿ“‚ Article ๐Ÿ“… 2003 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 358 KB

Accurate knowledge of defocus and tilt parameters is essential for the determination of three-dimensional protein structures at high resolution using electron microscopy. We present two computer programs, CTFFIND3 and CTFTILT, which determine defocus parameters from images of untilted specimens, as

The use of specimen tilt in transmission
The use of specimen tilt in transmission electron microscopy of the central nervous system
โœ Milroy, Antonia M. ;Ralston, Diane D. ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 994 KB

Thin sections of nervous tissue were viewed at different tilt angles using a transmission electron microscope equipped with a eucentric goniometer stage. In a comparison study of various degrees of tilt, one can observe additional morphological features within synaptic profiles, define subsynaptic s