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Accurate determination of local defocus and specimen tilt in electron microscopy

✍ Scribed by Joseph A. Mindell; Nikolaus Grigorieff

Book ID
117704552
Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
358 KB
Volume
142
Category
Article
ISSN
1047-8477

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Accurate determination of local defocus
Accurate determination of local defocus and specimen tilt in electron microscopy
✍ Joseph A. Mindell; Nikolaus Grigorieff πŸ“‚ Article πŸ“… 2003 πŸ› Elsevier Science 🌐 English βš– 358 KB

Accurate knowledge of defocus and tilt parameters is essential for the determination of three-dimensional protein structures at high resolution using electron microscopy. We present two computer programs, CTFFIND3 and CTFTILT, which determine defocus parameters from images of untilted specimens, as

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Thin sections of nervous tissue were viewed at different tilt angles using a transmission electron microscope equipped with a eucentric goniometer stage. In a comparison study of various degrees of tilt, one can observe additional morphological features within synaptic profiles, define subsynaptic s