Optimal imaging of complex structures requires proper alignment relative to the optic axis of the electron microscope. This is especially important for high-voltage and intermediatevoltage microscopes, which form an in-focus image throughout the entire thickness of the object. As a result, structure
โฆ LIBER โฆ
Tilted specimen in the electron microscope: A simple specimen holder and the calculation of tilt angles for crystalline specimens
โ Scribed by P.J. Shaw; G.J. Hills
- Publisher
- Elsevier Science
- Year
- 1981
- Weight
- 438 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0047-7206
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