Soft errors : from particles to circuits

✍ Scribed by Jean-Luc Autran; Daniela Munteanu

Publisher: CRC Press
Year: 2015
Tongue: English
Leaves: 432
Series: Devices, circuits, and systems
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits.

✦ Table of Contents

Content: Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices.
Abstract: This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits

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