This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits.</div>
Soft Errors: From Particles to Circuits
β Scribed by Jean-Luc Autran, Daniela Munteanu
- Publisher
- CRC Press
- Year
- 2015
- Tongue
- English
- Leaves
- 432
- Series
- Devices, Circuits, and Systems
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. It offers a practical knowledge and state-of-the-art survey of instrumentation developments in the fields of environment characterization, particle detection, and real-time/accelerated soft error tests, as well as examines recent computational advances and modeling and simulation strategies for the soft error rate estimation in cutting-edge digital circuits.
π SIMILAR VOLUMES
<p><p>This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in design of todayβs reliable electronic systems which are applicable to safety-critical applications, such as automotive or healthcare electr
<p><p>This book presents the proceedings of the international conference Particle Systems and Partial Differential Equations I, which took place at the Centre of Mathematics of the University of Minho, Braga, Portugal, from the 5th to the 7th of December, 2012.</p><p>The purpose of the conference wa
<p><span>This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adop
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en
<p>The main focus of this book is on different topics in probability theory, partial differential equations and kinetic theory, presenting some of the latest developments in these fields. It addresses mathematical problems concerning applications in physics, engineering, chemistry and biology that w