✦ LIBER ✦

Slow-electron-energy-loss spectroscopy in the reflection mode, compared with electron-energy-loss spectroscopy of fast electrons

✍ Scribed by A.G. Nassiopoulos; J. Cazaux

Publisher: Elsevier Science
Year: 1986
Weight: 57 KB
Volume: 165
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(86)91164-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Slow electron-energy-loss spectroscopy f

Slow electron-energy-loss spectroscopy for surface microanalysis

✍ A.G. Nassiopoulos; J. Cazaux 📂 Article 📅 1985 🏛 Elsevier Science ⚖ 53 KB

Kinetic theory of reflection electron en

Kinetic theory of reflection electron energy loss spectroscopy

✍ N.T. Bagraev; A.I. Gusarov; V.A. Mashkov 📂 Article 📅 1986 🏛 Elsevier Science ⚖ 335 KB

Surface microanalysis by reflection elec

Surface microanalysis by reflection electron energy-loss spectroscopy

✍ Wang, Z. L. 📂 Article 📅 1990 🏛 Wiley (John Wiley & Sons) 🌐 English ⚖ 668 KB

Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi

Optical properties from reflection elect

Optical properties from reflection electron energy loss spectroscopy

✍ G. Mondio; F. Neri; S. Patanè; A. Arena; G. Marletta; F. Iacona 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 486 KB

Problems in Electron Energy Loss Spectro

Problems in Electron Energy Loss Spectroscopy

✍ R. Leapman 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 109 KB

Thickness measurements with electron ene

Thickness measurements with electron energy loss spectroscopy

✍ K. Iakoubovskii; K. Mitsuishi; Y. Nakayama; K. Furuya 📂 Article 📅 2008 🏛 John Wiley and Sons 🌐 English ⚖ 401 KB

## Abstract Measurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers‐Kronig sum method. The EELS data analysis is even much easier with the log‐ratio method, however, absolute calibratio