Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi
โฆ LIBER โฆ
Slow electron-energy-loss spectroscopy for surface microanalysis
โ Scribed by A.G. Nassiopoulos; J. Cazaux
- Publisher
- Elsevier Science
- Year
- 1985
- Weight
- 53 KB
- Volume
- 149
- Category
- Article
- ISSN
- 0167-2584
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