Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi
β¦ LIBER β¦
Quantitative microanalysis by electron energy-loss spectroscopy: Two corrections
β Scribed by A.P. Stephens
- Publisher
- Elsevier Science
- Year
- 1980
- Tongue
- English
- Weight
- 316 KB
- Volume
- 5
- Category
- Article
- ISSN
- 0304-3991
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