✦ LIBER ✦

Thickness measurements with electron energy loss spectroscopy

✍ Scribed by K. Iakoubovskii; K. Mitsuishi; Y. Nakayama; K. Furuya

Publisher: John Wiley and Sons
Year: 2008
Tongue: English
Weight: 401 KB
Volume: 71
Category: Article
ISSN: 1059-910X
DOI: 10.1002/jemt.20597

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✦ Synopsis

Abstract

Measurements of thickness using electron energy loss spectroscopy (EELS) are revised. Absolute thickness values can be quickly and accurately determined with the Kramers‐Kronig sum method. The EELS data analysis is even much easier with the log‐ratio method, however, absolute calibration of this method requires knowledge of the mean free path of inelastic electron scattering λ. The latter has been measured here in a wide range of solids and a scaling law λ ∼ ρ^−0.3^ versus mass density ρ has been revealed. EELS measurements critically depend on the excitation and collection angles. This dependence has been studied experimentally and theoretically and an efficient model has been formulated. Microsc. Res. Tech., 2008. © 2008 Wiley‐Liss, Inc.

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