Slow electron-energy-loss spectroscopy for surface microanalysis
โ Scribed by A.G. Nassiopoulos; J. Cazaux
- Book ID
- 118985847
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 757 KB
- Volume
- 149
- Category
- Article
- ISSN
- 0039-6028
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Several basic physical concepts of applying eq. Ik = 1oN"t to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, u is the scattering cross section of element x wi
REELS, REM, Surface plasmon, Signal-to-background ratio Experimental conditions for obtaining the optimum signal-to-background ( S B ) ratio in reflection electron energy-loss spectroscopy (REELS) are investigated. It is shown that the S/ B ratio can be improved by lowering the incident energy of th