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SiO2 passivation film effects on YBCO junctions

✍ Scribed by Seiichi Tokunaga; Yusuke Ohkawa; Katsumi Suzuki; Youichi Enomoto

Book ID: 108466493
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 234 KB
Volume: 306
Category: Article
ISSN: 0921-4534
DOI: 10.1016/s0921-4534(98)00356-6

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