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-SiO studied by x-ray Raman scattering

✍ Scribed by Sakko, A.; Sternemann, C.; Sahle, Ch. J.; Sternemann, H.; Feroughi, O. M.; Conrad, H.; Djurabekova, F.; Hohl, A.; Seidler, G. T.; Tolan, M.; Hämäläinen, K.

Book ID: 125814620
Publisher: The American Physical Society
Year: 2010
Tongue: English
Weight: 465 KB
Volume: 81
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.81.205317

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