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thin film studied by Raman scattering and x-ray diffraction

✍ Scribed by Yuzyuk, Yu. I.; Simon, P.; Zakharchenko, I. N.; Alyoshin, V. A.; Sviridov, E. V.

Book ID: 124055263
Publisher: The American Physical Society
Year: 2002
Tongue: English
Weight: 79 KB
Volume: 66
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.66.052103

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