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Silicon nanocluster crystallization in SiO[sub x] films studied by Raman scattering

✍ Scribed by HernaÌndez, S.; MartiÌnez, A.; Pellegrino, P.; Lebour, Y.; Garrido, B.; Jordana, E.; Fedeli, J. M.

Book ID: 120386371
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 482 KB
Volume: 104
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.2968244

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