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Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering

✍ Scribed by Feroughi, O. M.; Sternemann, C.; Sahle, Ch. J.; Schroer, M. A.; Sternemann, H.; Conrad, H.; Hohl, A.; Seidler, G. T.; Bradley, J.; Fister, T. T.; Balasubramanian, M.; Sakko, A.; Pirkkalainen, K.; HaÌmaÌlaÌinen, K.; Tolan, M.

Book ID: 120668258
Publisher: American Institute of Physics
Year: 2010
Tongue: English
Weight: 412 KB
Volume: 96
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3323106

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