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Single-transistor-latch-induced degradation of front- and back-channel thin-film SOI transistors

✍ Scribed by Zhang, B.; Yoshino, A.; Ma, Tso-Ping

Book ID: 118750699
Publisher: IEEE
Year: 1992
Tongue: English
Weight: 257 KB
Volume: 13
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.145054

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