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Single event upset and total dose radiation effects on rad-hard SRAMs

✍ Scribed by V. Zajic; K. Kloesel; D. Ngo; P. M. Kibuule; A. Oladipupo; T. N. Fogarty; R. A. Kohler; E. G. Stassinopulos

Book ID: 112814861
Publisher: Springer US
Year: 1990
Tongue: English
Weight: 820 KB
Volume: 19
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02655237

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