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[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters

✍ Scribed by Irom, Farokh; Agarwal, Shri G.

Book ID: 118067725
Publisher: IEEE
Year: 2012
Weight: 589 KB
Category: Article
ISBN: 1467327301
DOI: 10.1109/redw.2012.6353729

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