𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - SEU, SET, and SEFI Test Results of a Hardened 16Mbit MRAM Device

✍ Scribed by Hafer, Craig; Von Thun, Matt; Mundie, Michelle; Bass, Derek; Sievert, Fred

Book ID: 118736088
Publisher: IEEE
Year: 2012
Weight: 353 KB
Category: Article
ISBN: 1467327301
DOI: 10.1109/REDW.2012.6353717

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Compendium of Radiation Test Results from Ball Aerospace & Technologies Corp.

✍ Scott, Katherine; Bird, John; Davies, Robert 📂 Article 📅 2012 🏛 IEEE ⚖ 425 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Compendium of Recent Test Results of Single Event Effects Conducted by the Jet Propulsion Laboratory

✍ Allen, Gregory R.; Guertin, Steven M.; Scheick, Leif Z.; Irom, Farokh; Zajac, St 📂 Article 📅 2012 🏛 IEEE ⚖ 356 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Radiation Test Results on COTS and Non-COTS Electronic Devices for NASA Johnson Space Center Spaceflight Projects

✍ Allums, Kimberly K.; ONeill, Patrick M.; Reddell, Brandon D.; Bailey, Charles R. 📂 Article 📅 2012 🏛 IEEE ⚖ 885 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Compendium of Single-Event Latchup and Total Ionizing Dose Test Results of Commercial Analog to Digital Converters

✍ Irom, Farokh; Agarwal, Shri G. 📂 Article 📅 2012 🏛 IEEE ⚖ 589 KB

[IEEE 2012 IEEE Radiation Effects Data W

[IEEE 2012 IEEE Radiation Effects Data Workshop (in conjunction with NSREC 2012) - Miami, FL, USA (2012.07.16-2012.07.20)] 2012 IEEE Radiation Effects Data Workshop - Total Dose and Transient Response of SiGe HBTs from a New 4th-Generation, 90 nm SiGe BiCMOS Technology

✍ Lourenco, Nelson E.; Schmid, Robert L.; Moen, Kurt A.; Phillips, Stanley D.; Eng 📂 Article 📅 2012 🏛 IEEE ⚖ 778 KB