✦ LIBER ✦
[IEEE 2010 Radiation Effects Data Workshop - denver, CA, USA (2010.07.20-2010.07.23)] 2010 IEEE Radiation Effects Data Workshop - Single Event Latchup (SEL) and Total Ionizing Dose (TID) of a 1 Mbit Magnetoresistive Random Access Memory (MRAM)
✍ Scribed by Heidecker, Jason; Allen, Gregory; Sheldon, Douglas
- Book ID
- 118059004
- Publisher
- IEEE
- Year
- 2010
- Weight
- 465 KB
- Volume
- 0
- Category
- Article
- ISBN
- 1424484057
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