✦ LIBER ✦

Simulation of hot-electron trapping and aging of nMOSFETs

✍ Scribed by Roblin, P.; Samman, A.; Bibyk, S.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Hot-carrier-injected oxide region and ho

✍ Tsuchiya, T.; Kobayashi, T.; Nakajima, S. 📂 Article 📅 1987 🏛 IEEE 🌐 English ⚖ 706 KB

Trapping of hot electrons

✍ D.R. Wolters; A.T.A. Zegers-van Duynhoven 📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 391 KB

Simulation of substrate hot-electron inj

✍ Pagaduan, F.E.; Yang, C.Y.; Toyabe, T.; Nishioka, Y.; Hamada, A.; Igura, Y.; Tak 📂 Article 📅 1990 🏛 IEEE 🌐 English ⚖ 569 KB

Numerical simulation of hot-electron phe

✍ Watanabe, D.S.; Slamet, S. 📂 Article 📅 1983 🏛 IEEE 🌐 English ⚖ 807 KB

Dynamic simulation of electron trapping

✍ Jian-Yang Lin; Ping-Chung Tien; Heuy-Liang Hwang 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 260 KB

A bidirectional NMOSFET current reductio

✍ Quader, K.N.; Li, C.C.; Tu, R.; Rosenbaum, E.; Ko, P.K.; Chenming Hu 📂 Article 📅 1993 🏛 IEEE 🌐 English ⚖ 937 KB