✦ LIBER ✦

Dynamic simulation of electron trapping and device lifetime of LDDnMOSFET

✍ Scribed by Jian-Yang Lin; Ping-Chung Tien; Heuy-Liang Hwang

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Device simulation of carrier lifetime-co

✍ Kenji Sugimoto; Hiroshi Sakata; Shigehiro Isomura 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 831 KB

Simulation of hot-electron trapping and

✍ Roblin, P.; Samman, A.; Bibyk, S. 📂 Article 📅 1988 🏛 IEEE 🌐 English ⚖ 866 KB

Device and circuit simulation of quantum

✍ Mohan, S.; Sun, J.P.; Mazumder, P.; Haddad, G.I. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 1016 KB

The lifetime of electrons, holes and exc

✍ Mott, N F; Stoneham, A M 📂 Article 📅 1977 🏛 Institute of Physics 🌐 English ⚖ 554 KB

Numerical simulation and measurement of

✍ Lakshminarayana, M.R.; Partain, L.D. 📂 Article 📅 1980 🏛 IEEE 🌐 English ⚖ 814 KB

ESR dating and trapped electrons lifetim

✍ Huang Pei-Hua, ; Jin Si-Zhao, ; Peng Zhi-Cheng, ; Liang Ren-Yu, ; Quan Yu-cai, ; 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 297 KB