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A bidirectional NMOSFET current reduction model for simulation of hot-carrier-induced circuit degradation

โœ Scribed by Quader, K.N.; Li, C.C.; Tu, R.; Rosenbaum, E.; Ko, P.K.; Chenming Hu


Book ID
114535469
Publisher
IEEE
Year
1993
Tongue
English
Weight
937 KB
Volume
40
Category
Article
ISSN
0018-9383

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