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Simulation of gate lag and current collapse in gallium nitride field-effect transistors

✍ Scribed by Braga, N.; Mickevicius, R.; Gaska, R.; Shur, M. S.; Khan, M. Asif; Simin, G.

Book ID: 125902124
Publisher: American Institute of Physics
Year: 2004
Tongue: English
Weight: 318 KB
Volume: 85
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.1823018

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