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SIMS analysis of impurities and nitrogen isotopes in gallium nitride thin films

✍ Scribed by Hajime Haneda; Takeshi Ohgaki; Isao Sakaguchi; Haruki Ryoken; Naoki Ohashi; Atsuo Yasumori

Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
309 KB
Volume
252
Category
Article
ISSN
0169-4332

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