Sims image analysis of D2O migration in ZrO2 thin films

✍ Scribed by Clarke, A. H.; McIntyre, N. S.

• Publisher: John Wiley and Sons
• Year: 1997
• Tongue: English
• Weight: 227 KB
• Volume: 25
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199711)25:12<948::aid-sia338>3.0.co;2-k

✦ Synopsis

The di †usion of into and through oxide Ðlms on Zr-Nb alloys was investigated using secondary ion mass D 2 O spectrometry (SIMS) image analysis. In preparation for this, the microscopic structures of the oxide were studied in relation to the grain structures in the underlying alloy. On alloys containing low concentrations of niobium (1-2.5 wt.% ), the oxide was found to exhibit more localized growth, particularly above grain boundaries in the alloy. Such oxide regions appeared to be considerably more porous to ingress. By contrast, the oxide Ðlm on the Zr 20 D 2 O wt.% Nb alloy was found to be the most resistant to ingress ; no local regions of higher porosity could be D 2 O found.