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Electron and photocurrents in thin films of ZrO2

✍ Scribed by D.A. Vermilyea


Publisher
Elsevier Science
Year
1954
Weight
321 KB
Volume
2
Category
Article
ISSN
0001-6160

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Sims image analysis of D2O migration in
✍ Clarke, A. H.; McIntyre, N. S. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 227 KB

The di †usion of into and through oxide Ðlms on Zr-Nb alloys was investigated using secondary ion mass D 2 O spectrometry (SIMS) image analysis. In preparation for this, the microscopic structures of the oxide were studied in relation to the grain structures in the underlying alloy. On alloys contai