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In situ thin film differential thermal analysis of amorphous V2O5 thin films

✍ Scribed by J.P. Audière; A. Madi

Publisher: Elsevier Science
Year: 1983
Tongue: English
Weight: 147 KB
Volume: 101
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(83)90270-5

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