Characterization of light element impurities in gallium-nitride-phosphide by SIMS analysis

✍ Scribed by R.C. Reedy; J.F. Geisz; A.J. Ptak; B.M. Keyes; W.K. Metzger

• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 127 KB
• Volume: 231-232
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2004.03.080