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Simple method for the complete optical analysis of very thick and weakly absorbing films

✍ Scribed by I. Ohlídal; K. Navrátil; E. Schmidt

Publisher: Springer
Year: 1982
Tongue: English
Weight: 433 KB
Volume: 29
Category: Article
ISSN: 1432-0630
DOI: 10.1007/bf00617773

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