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A new method for the complete optical analysis of weakly absorbing thin films: Application to polycrystalline silicon films

✍ Scribed by I. Ohlídal; K. Navrátil; J. Musilová


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
624 KB
Volume
127
Category
Article
ISSN
0040-6090

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