✦ LIBER ✦

Simple method of spectroscopic reflectometry for the complete optical analysis of weakly absorbing thin films: Application to silicon films

✍ Scribed by I. Ohlídal; K. Navrátil

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Optical analysis of inhomogeneous weakly

✍ I. Ohlídal; K. Navrátil 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 428 KB

A new method for the complete optical an

✍ I. Ohlídal; K. Navrátil; J. Musilová 📂 Article 📅 1985 🏛 Elsevier Science 🌐 English ⚖ 624 KB

Complete optical analysis of a non-absor

✍ I. Ohlídal; K. Navrátil 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 617 KB

Determination of the optical parameters

✍ I. Ohlídal; K. Navrátil 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 426 KB

A method for the measurement of thin fil

✍ R. Brendel; R. Ziegler; R. Hezel 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 665 KB