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The ellipsometrical method for the determination of the thickness and the dispersion of the optical constants of thin absorbing films evaporated on metal substrates

✍ Scribed by I.N. Shklyarevskii; A.F.A. El-Shazly; V.P. Kostyuk

Publisher
Elsevier Science
Year
1972
Tongue
English
Weight
251 KB
Volume
10
Category
Article
ISSN
0038-1098

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