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Silicon oxide structures measured at the surfaces of silicon and silicate glass: a reflectivity study

✍ Scribed by G.E. van Dorssen; G. Derst; G.N. Greaves; A.D. Smith; M. Roper

Book ID: 113284826
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 339 KB
Volume: 97
Category: Article
ISSN: 0168-583X
DOI: 10.1016/0168-583x(94)00387-4

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