✦ LIBER ✦

A study comparing measurements of roughness of silicon and SiO2 surfaces and interfaces using scanning probe microscopy and neutron reflectivity

✍ Scribed by A. Crossley; C.J. Sofield; J.P. Goff; A.C.I. Lake; M.T. Hutchings; A. Menelle

Book ID: 115990430
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 562 KB
Volume: 187
Category: Article
ISSN: 0022-3093
DOI: 10.1016/0022-3093(95)00216-2

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Characterisation of rough silicon surfac

Characterisation of rough silicon surfaces using spectroscopic ellipsometry, reflectance, scanning electron microscopy and scattering measurements

✍ C. Pickering; R. Greef; A.M. Hodge 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 423 KB

A critical comparison of several techniques for the evaluation of imperfections in sificon-onsapphire (SOS) wafers leads to the adoption of a model of the SOS surface based on an effective medium approximation treatment of the ellipsometric" results.

A scanning probe microscopy study of the

A scanning probe microscopy study of the (001) surfaces of V2O5 and V6O13

✍ Richard L. Smith; Gregory S. Rohrer; K.S. Lee; D.-K. Seo; M.-H. Whangbo 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 734 KB

Neutron Reflectivity and Atomic Force Mi

Neutron Reflectivity and Atomic Force Microscopy Studies of a Lipid Bilayer in Water Adsorbed to the Surface of a Silicon Single Crystal

✍ Koenig, B. W.; Krueger, S.; Orts, W. J.; Majkrzak, C. F.; Berk, N. F.; Silverton 📂 Article 📅 1996 🏛 American Chemical Society 🌐 English ⚖ 359 KB

Orientation of a Monoclonal Antibody Ads

Orientation of a Monoclonal Antibody Adsorbed at the Solid/Solution Interface: A Combined Study Using Atomic Force Microscopy and Neutron Reflectivity

✍ Xu, Hai; Zhao, Xiubo; Grant, Colin; Lu, Jian R.; Williams, David E.; Penfold, Je 📂 Article 📅 2006 🏛 American Chemical Society 🌐 English ⚖ 219 KB

A spectroscopic immersion ellipsometry s

A spectroscopic immersion ellipsometry study of SiO2-Si interface roughness for electron cyclotron resonance plasma and thermally oxidized Si surfaces

✍ C. Zhao; P.R. Lefebvre; E.A. Irene 📂 Article 📅 1998 🏛 Elsevier Science 🌐 English ⚖ 321 KB

Study of resonant tunneling in Au nanocl

Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique

✍ M. A. Lapshina; D. O. Filatov; D. A. Antonov; N. S. Barantsev 📂 Article 📅 2009 🏛 Pleiades Publishing 🌐 English ⚖ 281 KB