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Study of resonant tunneling in Au nanoclusters on the surface of SiO2/Si thin films using the combined scanning tunneling microscopy and atomic-force microscopy technique

✍ Scribed by M. A. Lapshina; D. O. Filatov; D. A. Antonov; N. S. Barantsev

Book ID: 110203109
Publisher: Pleiades Publishing
Year: 2009
Tongue: English
Weight: 281 KB
Volume: 3
Category: Article
ISSN: 1027-4510
DOI: 10.1134/s1027451009040132

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