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A comparative study of the atomic hydrogen penetration into thin vanadium films and silicon oxide-gallium arsenide structures

✍ Scribed by V. G. Bozhkov; V. A. Kagadei; D. I. Proskurovskii; L. M. Romas’

Book ID: 110125234
Publisher: SP MAIK Nauka/Interperiodica
Year: 2000
Tongue: English
Weight: 45 KB
Volume: 26
Category: Article
ISSN: 1063-7850
DOI: 10.1134/1.1321241

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