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Si1−xGex thin films deposited by the pulsed excimer laser ablation technique

✍ Scribed by F. Antoni; E. Fogarassy; C. Fuchs; B. Prévot; J.P. Stoquert

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 445 KB
Volume: 86
Category: Article
ISSN: 0169-4332
DOI: 10.1016/0169-4332(94)00374-2

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