The time-of-flight effect in Fourier transform mass spectrometry (FTMS) with an external ion source was quantified. The time-of-flight profiles of ions of different masses were measured by stepping the time interval between the ionization pulse and the gating of the trapping voltage (T gate ). The o
Sequential mass spectrometry and MSn analyses of combinatorial libraries by using automated matrix-assisted laser desorption/ionization Fourier transform mass spectrometry
โ Scribed by Diane C. Tutko; Kent D. Henry; Brian E. Winger; Howard Stout; Mark Hemling
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 211 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0951-4198
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โฆ Synopsis
This note demonstrates that accurate mass and MS/MS data can be rapidly and easily obtained using an automated matrix-assisted laser desorption/ionization Fourier transform MS procedure for multiple samples. Multiple ionization techniques were used simultaneously in order to introduce sample and mass reference ions into the Fourier transform ion cyclotron resonance cell. In this way 20 samples from a combinatorial library were analyzed automatically in one hour, with RMS errors of less than 5 ppm for the masses of both parent and fragment ions.
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