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SeparateIDDQtesting of signal and bias paths in CMOS ICs for defect diagnosis

✍ Scribed by Manoj Sachdev

Book ID: 105538423
Publisher: Springer US
Year: 1996
Tongue: English
Weight: 871 KB
Volume: 8
Category: Article
ISSN: 0923-8174
DOI: 10.1007/bf02341824

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