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Diagnosis of resistive-open and stuck-open defects in digital CMOS ICs

✍ Scribed by James Chien-Mo Li; McCluskey, E.J.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Universal and robust testing of stuck-op

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Analysis and Test of Resistive-Open Defe

✍ Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel; Magali Ba 📂 Article 📅 2007 🏛 Springer US 🌐 English ⚖ 231 KB

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✍ Manoj Sachdev 📂 Article 📅 1996 🏛 Springer US 🌐 English ⚖ 871 KB

Testing of stuck-open faults in generali

✍ Rahaman, H.; Das, D.K.; Bhattacharya, B.B. 📂 Article 📅 2004 🏛 The Institution of Electrical Engineers 🌐 English ⚖ 464 KB

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✍ R. Sohaey; T. Tredennick; A. Kennedy; K. Oh; N. Selden 📂 Article 📅 2007 🏛 John Wiley and Sons 🌐 English ⚖ 38 KB

SHOULD ULTRASOUND BE USED TO ESTIMATE GE

✍ Wald, NicholasJ.; Cuckle, HowardS.; Haddow, JamesE. 📂 Article 📅 1980 🏛 The Lancet 🌐 English ⚖ 156 KB