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Testing of stuck-open faults in generalised Reed-Muller and EXOR sum-of-products CMOS circuits

✍ Scribed by Rahaman, H.; Das, D.K.; Bhattacharya, B.B.

No coin nor oath required. For personal study only.

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Universal and robust testing of stuck-op

✍ Das, Debesh K.; Chakraborty, Susanta; Bhattacharya, Bhargab B. 📂 Article 📅 2003 🏛 Taylor and Francis Group 🌐 English ⚖ 146 KB