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Semiconductor wafer carrier uses Trelleborg technology


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
148 KB
Volume
2010
Category
Article
ISSN
1350-4789

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Easy-to-use surface passivation techniqu
โœ Jan Schmidt; Armin G. Aberle ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 155 KB

A novel, easily applicable surface passivation technique is presented, which, in combination with contactless photocoductance decay (PCD) measurements, allows a quick estimation of the bulk carrier lifetime of crystalline silicon wafers. The proposed passivation technique requires neither a chemical