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Self-Diffusion in Silicon: Similarity between the Properties of Native Point Defects

✍ Scribed by Ural, Ant; Griffin, P. B.; Plummer, J. D.

Book ID: 121457412
Publisher: The American Physical Society
Year: 1999
Tongue: English
Weight: 69 KB
Volume: 83
Category: Article
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.83.3454

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